TY  - CONF
AU  - Jach, Terrence
AU  - Durbin, S
AU  - Bakulin, A
AU  - Bright, David
AU  - Stagarescu, C
AU  - Srajer, G
AU  - Haskel, D.
AU  - Pedulla, J
C2  - X-Ray Micro- and Nano-Focusing: Applications and Techniques, Conference | | X-Ray Micro- and Nano-Focusing: Applications and Techniques II | SPIE, Arlington, TX
DA  - 2001-12-01
LA  - en
M1  - 4499
PB  - X-Ray Micro- and Nano-Focusing: Applications and Techniques, Conference | | X-Ray Micro- and Nano-Focusing: Applications and Techniques II | SPIE, Arlington, TX
PY  - 2001
TI  - Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
ER  -