TY  - CONF
AU  - Guo, Shu
AU  - Stafford, Christopher
AU  - Chiang, Martin
C2  - Adhesion Society | 28th | Annual Meeting Proceedings
DA  - 2005-01-01
LA  - en
M1  - 16
PB  - Adhesion Society | 28th | Annual Meeting Proceedings
PY  - 2005
TI  - Stress Analysis for Combinatorial Buckling-Based Metrology of Thin Film Modulus
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852471
ER  -