TY  - JOUR
AU  - Wallace, William
AU  - Jacobson, David
AU  - Arif, Muhammad
AU  - Ioffe, A
C2  - Applied Physics Letters
DA  - 1999-01-01
LA  - en
M1  - 74
PB  - Applied Physics Letters
PY  - 1999
TI  - Application of Neutron Interferometry to the Measurement of Thin Film Density
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851480
ER  -