TY  - JOUR
AU  - Shrestha, Pragya
AU  - Cheung, Kin
AU  - Campbell, Jason
AU  - Ryan, Jason
AU  - Baumgart, Helmut
C2  - IEEE Transactions on Electron Devices
DA  - 2014-07-01
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 2014
TI  - Accurate Fast Capacitance Measurements for Reliable Device Characterization
ER  -