TY  - GEN
AU  - Craig, Rex M
AU  - Wang, Chih-Ming
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2003-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.250-60
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2003
TI  - NIST measurement services ::measurement assurance program for wavelength dependence of polarization dependent loss in fiber optic devices over the wavelength range from 1535 nm to 1560 nm
ER  -