TY  - GEN
AU  - Bonevich, John
AU  - Debay, Ann Chiaramonti
AU  - Herzing, Andrew
AU  - Keller, Bob
AU  - Lau, June
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-12-01 05:12:00
DO  - https://doi.org/10.6028/NIST.SP.1217
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - A workshop report on "electron microscopy frontiers: challenges and opportunities":
ER  -