TY  - GEN
AU  - Fiumara, Gregory
AU  - Tabassi, Elham
AU  - Flanagan, Patricia
AU  - Grantham, John
AU  - Ko, Kenneth
AU  - Marshall, Karen
AU  - Schwarz, Matthew
AU  - Woodgate, Bryan
AU  - Boehnen, Christopher
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2018-05-01 04:05:00
DO  - https://doi.org/10.6028/NIST.IR.8210
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2018
TI  - Nail to nail fingerprint challenge: prize analysis:
ER  -