TY  - GEN
AU  - Lucon, Enrico
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2018-04-01 04:04:00
DO  - https://doi.org/10.6028/NIST.IR.8211
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2018
TI  - New software for the statistical analysis and qualification of NIST charpy verification specimen lots.:
ER  -