TY  - GEN
AU  - Lucon, Enrico
AU  - Santoyo, Raymond L.
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2016-08-01 04:08:00
DO  - https://doi.org/10.6028/NIST.IR.8145
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2016
TI  - A Comparative Analysis of NIST Charpy Machines and Internal Reference Materials:
ER  -