TY  - GEN
AU  - Michaloski, John
AU  - Hedberg, Tom
AU  - Huang, Hui
AU  - Kramer, Thomas
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2016-05-01 04:05:00
DO  - https://doi.org/10.6028/NIST.IR.8127
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2016
TI  - End-to-End Quality Information Framework (QIF) Technology Survey:
ER  -