TY  - GEN
AU  - Seltzer, Stephen M.
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-10-01 04:10:00
DO  - https://doi.org/10.6028/NIST.IR.7887
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - Correction Factors for the NIST Free-Air Ionization Chambers Used to Realize Air Kerma fromW-Anode X-Ray Beams:
ER  -