TY  - GEN
AU  - Indovina, Michael
AU  - Dvornychenko, V.
AU  - Hicklin, R.A.
AU  - Kiebuzinski, G.I
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-05-01 04:05:00
DO  - https://doi.org/10.6028/NIST.IR.7859
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - ELFT-EFS Evaluation of Latent Fingerprint Technologies: Extended Feature Sets [Evaluation #2]:
ER  -