TY  - GEN
AU  - Moylan, Shawn
AU  - Cooke, April
AU  - Jurrens, Kevin
AU  - Slotwinski, John
AU  - Donmez, M. Alkan
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-05-01 04:05:00
DO  - https://doi.org/10.6028/NIST.IR.7858
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - A Review of Test Artifacts for Additive Manufacturing:
ER  -