TY  - GEN
AU  - Quinn, G W
AU  - Grother, P
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7853
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - IREX III ::spuulement I : failure analysis
ER  -