TY  - GEN
AU  - Creuziger, Adam
AU  - Vaudin, Mark
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2011-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7814
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2011
TI  - Report on VAMAS round robin of ISO 13067 ::microbeam analysis - electron backscatter diffraction - measurement of average grain size
ER  -