TY  - GEN
AU  - Indovina, M
AU  - Hicklin, R A
AU  - Kiebuzinski, G I
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2011-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7775
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2011
TI  - ELFT-EFS Evaluation of Latent Fingerprint Technologies ::Extended Feature Sets [evaluation #1]
ER  -