TY  - GEN
AU  - Baker, S E
AU  - Bowyer, K W
AU  - Flynn, P J
AU  - Phillips, P J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2011-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7752
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2011
TI  - Empirical evidence for increased false reject rate with time lapse in ICE 2006:
ER  -