TY  - GEN
AU  - Fong, Elizabeth
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2005-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7210
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2005
TI  - Conformance testing of the government smart card:
ER  -