TY  - GEN
AU  - Horst, John
AU  - Kramer, Thomas
AU  - Stouffer, Keith
AU  - Falco, Joseph
AU  - Huang, Hui-Min
AU  - Proctor, Frederick
AU  - Wavering, Albert
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2002-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6851
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2002
TI  - Distributed testing of a device-level interface specification for a metrology system:
ER  -