TY  - GEN
AU  - Obrzut, Jan
AU  - Chiang, C K
AU  - Popielarz, R
AU  - Nozaki, R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6537
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Evaluation of dielectric properties of polymer thin-film materials for application in embedded capacitance:
ER  -