TY  - GEN
AU  - Sudarsan, R
AU  - Roy, U
AU  - Narahari, Y
AU  - Sriram, RD
AU  - Lyons, K W
AU  - Pramanik, N
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6524
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Information models for design tolerancing::from conceptual to the detail design
ER  -