TY  - GEN
AU  - DeVaux, Christine R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6492
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - A review of U.S. participation in the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC):
ER  -