TY  - GEN
AU  - Schlenoff, Craig
AU  - Denno, Peter
AU  - Libes, Don
AU  - Szykman, Simon
AU  - Ivester, Robert
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1999-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6301
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1999
TI  - An analysis of existing ontological systems for applications in manufacturing and healthcare:
ER  -