TY  - GEN
AU  - Dagata, J A
AU  - Diebold, A C
AU  - Shih, C K
AU  - Colton, R J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1995-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.5752
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1995
TI  - Summary report::second workshop on industrial applications of scanned probe microscopy, May 2-3, 1995
ER  -