TY  - GEN
AU  - Phillips, S D
AU  - Borchardt, B
AU  - Estler, W T
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1995-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.5698
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1995
TI  - The estimation of measurement uncertainty of small circular features measured by CMMs:
ER  -