TY  - GEN
AU  - Cook, L P
AU  - Schenck, P K
AU  - Chiang, C K
AU  - Vaudinl, M D
AU  - Wong-ng, W
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1992-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4844
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1992
TI  - Ferroelectric thin films prepared by pulsed laser deposition processing and characterization:
ER  -