TY  - GEN
AU  - Guttman, Charles M
AU  - Maurey, John R
AU  - Verdier, Peter H
AU  - Han, Charles C
AU  - Wang, Francis W
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1992-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4788
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1992
TI  - Development of characterization techniques for polyurethanes I. Characterization of SRM 1480, a low molecular weight polyurethane for SEC calibration:
ER  -