TY  - GEN
AU  - Swyt, Dennis A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1992-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4757
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1992
TI  - Challenges to NIST in dimensional metrology::the impact of tightening tolerances in the U.S. discrete-part manufacturing industry
ER  -