TY  - GEN
AU  - Lee, Y Tina
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4358
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - On extending the standard for the exchange of product data to represent two-dimensional apparel pattern pieces:
ER  -