TY  - GEN
AU  - Kopanski, J J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4352
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - MIS capacitor studies on silicon carbide single crystals::final report for May 8, 1989 to November 8, 1989
ER  -