TY  - GEN
AU  - Swankin, David A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-02-01 05:02:00
DO  - https://doi.org/10.6028/NIST.GCR.90-571
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - How due process in the development of voluntary standards can reduce the risk of anti-trust liability:
ER  -