TY  - GEN
AU  - Krima, Sylvere
AU  - Hedberg, Thomas
AU  - Barnard-Feeney, Allison
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-02-01 05:02:00
DO  - https://doi.org/10.6028/NIST.AMS.300-6
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Securing the digital threat for smart manufacturing::a reference model for blockchain-based product data traceability
ER  -