TY  - GEN
AU  - Hedberg, Jr
AU  - Helu, Moneer
AU  - Krima, Sylvere
AU  - Feeney, Allison Barnard
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-07-01 04:07:00
DO  - https://doi.org/10.6028/NIST.AMS.300-10
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Recommendations on ensuring traceability and trustworthiness of manufacturing-related data:
ER  -