TY  - GEN
AU  - Narayanan, Anantha
AU  - Ak, Ronay
AU  - Lee, Yung-Tsun Tina
AU  - Ghosh, Rumi
AU  - Rachuri, Sudarsan
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-04-01 04:04:00
DO  - https://doi.org/10.6028/NIST.AMS.100-7
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - Summary of the symposium on data analytics for advanced manufacturing:
ER  -