TY  - GEN
AU  - Bullis, W Murray
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1972-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.743
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1972
TI  - Methods of measurement for semiconductor materials, process control, and devices quarterly report ::April 1 to June 30, 1972
ER  -