TY  - GEN
AU  - Mattis, Richard L
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1972-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.736
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1972
TI  - Carrier lifetime measurement by the photoconductive decay method:
ER  -