TY  - GEN
AU  - Hoer, Cletus A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1975-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.673
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1975
TI  - Using six-port and eight-port junctions to measure active and passive circuit parameters:
ER  -