TY  - GEN
AU  - Mohan, Kshitij
AU  - Schaefer, A Russell
AU  - Zalewski, Edward F
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1973-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.594-5
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1973
TI  - Optical radiation measurements::stability and temperature characteristics of some silicon and selenium photodetectors
ER  -