TY  - GEN
AU  - Heinrich, Kurt F J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1965-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.278
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1965
TI  - Scanning electron probe microanalysis.:
ER  -