TY  - GEN
AU  - Eckerle, Kenneth L
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1980-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.1125
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1980
TI  - Photometry and colorimetry of retroreflection ::State-of-measurement-accuracy report
ER  -