TY  - GEN
AU  - Harman, George G
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.400-70
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages:
ER  -