TY  - GEN
AU  - Ham, W E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1980-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.400-56
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1980
TI  - Comprehensive test pattern and approach for characterizing SOS technology:
ER  -