TY  - GEN
AU  - Heinrich, K F J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1968-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.298
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1968
TI  - Quantitative electron probe microanalysis ::Proceedings of a seminar held at the National Bureau of Standards, Gaithersburg, Maryland, June 12-13, 1967
ER  -