TY  - GEN
AU  - Geil, G W
AU  - Feinberg, I J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1969-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.RPT.9996
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1969
TI  - Microplasticity I ::measurement of small microstrains at ambient temperature
ER  -