TY  - GEN
AU  - Greenfeld, S H
AU  - Weeks, J C
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1963-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.RPT.8110
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1963
TI  - A comparison of thin-film oxidation with conventional weatherometer exposures:
ER  -