TY  - GEN
AU  - Turgel, R S
AU  - Laug, O B
AU  - Leedy, T E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1988-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.88-3736
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1988
TI  - Electrical performance tests for true-RMS voltmeters:
ER  -