TY  - GEN
AU  - Larson, Lee E
AU  - Larson, Donald R
AU  - Phelan, Robert J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1988-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.88-3092
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1988
TI  - System for measuring optical waveguide intensity profiles:
ER  -