TY  - GEN
AU  - Carver, G P
AU  - Wachnik, R A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1984-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.84-2894
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1984
TI  - TERRY-2 ::a test chip for characterization of the performance of buried-channel Charge-Coupled Device (CCD) imagers
ER  -