TY  - GEN
AU  - Widerhorn, S M
AU  - Tighe, N J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1983-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.83-2664
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1983
TI  - Structural reliability of yttria-doped, hot-pressed silicon nitride at elevated temperatures:
ER  -