TY  - GEN
AU  - Frederickse, H P R
AU  - Dragoo, A L
AU  - Kahn, A H
AU  - Hosler, W R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1983-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.83-2646
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1983
TI  - Characterization of microwave window materials:
ER  -